Re: Linear regression, error on both vaules x and y
- To: mathgroup at smc.vnet.net
- Subject: [mg70081] Re: Linear regression, error on both vaules x and y
- From: "Ray Koopman" <koopman at sfu.ca>
- Date: Mon, 2 Oct 2006 00:34:15 -0400 (EDT)
- References: <efldqq$d9l$1@smc.vnet.net>
Ralph Kube wrote: > Hi, > I measured the hall-current of a Ge-semiconductor. The experiment > yielded data for the current and for the voltage, both with their > own error. Both measurements are uncorrelated. > Now both the voltage and the current have individual uncertainties > due to the method of measurement. > How can I perform a linear fit of this dataset and incorporate both errors? > Ralph Kube Do you mean the voltage uncertainty varies from measure to measure, and similarly for the current uncertainty? Are the uncertainties absolute (i.e., standard deviations) or relative (i.e., coefficients of variation)? Are they known, or only estimated?